tests.7: Remove an unused configuration variable
No existing tests require it, and I cannot understand what kinds of test scenarios are supposed to require it. Just remove it. While here, improve the documentation of test variables a bit. Reviewed by: ngie MFC after: 1 week Differential Revision: https://reviews.freebsd.org/D56604
This commit is contained in:
+5
-12
@@ -219,23 +219,16 @@ skipped.
|
||||
.Pp
|
||||
Test suites are configured by defining their configuration
|
||||
variables in
|
||||
.Pa /etc/kyua/kyua.conf .
|
||||
The format of this file is detailed in
|
||||
.Pa /etc/kyua/kyua.conf
|
||||
or on the command line.
|
||||
The format of the configuration file is detailed in
|
||||
.Xr kyua.conf 5 .
|
||||
.Pp
|
||||
The following configuration variables are available in the
|
||||
.Fx
|
||||
Test Suite:
|
||||
Test Suite; all of the variable names are prefixed with
|
||||
.Va test_suites.FreeBSD. .
|
||||
.Bl -tag -width "allow_sysctl_side_effects"
|
||||
.It Va allow_devfs_side_effects
|
||||
If defined, enables tests that may destroy and recreate semipermanent device
|
||||
nodes, like disk devices.
|
||||
Without this variable, tests may still create and destroy devices nodes that
|
||||
are normally transient, like /dev/tap* and /dev/pts*, as long as they clean
|
||||
them up afterwards.
|
||||
However, tests that require this variable have a relaxed cleanup requirement;
|
||||
they must recreate any devices that they destroyed, but not necessarily with
|
||||
the same devnames.
|
||||
.It Va allow_sysctl_side_effects
|
||||
Enables tests that change globally significant
|
||||
.Xr sysctl 8
|
||||
|
||||
Reference in New Issue
Block a user